KLA
Provisional entry — research in progress
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Wafer size
150mm
Performance
10Å (1s) or 0.1%[3]
The KLA Alpha Step 500 is a stylus-based surface profiler designed for two-dimensional step height metrology profiling. The Alpha Step 500 is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height. The instrument provides repeatability of 10 Å (1σ) or 0.1% and supports step height measurements from below 50 nm to 300 µm, with an optional vertical range of 2 mm for tall steps found in MEMS and thick film hybrid circuits.[4][5]
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It is a profilometer.[2]
The make is KLA and the model is Alpha Step 500.[2]
It does not include PC or software.[2]
The following facts about the Alpha Step 500 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Alpha Step 500 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Alpha Step 500 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Alpha Step 500 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Alpha Step 500 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Alpha Step 500 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.
The Filmetrics F50 is an optical film thickness and wafer-mapping system for thickness and optical property measurements on substrates.
KLA P/N: 0023889-00 is a wafer vacuum chuck compatible with KLA SP1 Classic, SP1-TBi, and SP1-DLS systems.
The KLA SFS 6420 is a wafer inspection system for non-patterned particle detection, compatible with 150 mm and 200 mm wafers, using an Algon laser source.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.