Waferpedia

Olympus

OLS 5100 SAF

Metrology & InspectionOlympus OLS family
Research Quality: 50% complete

Olympus OLS 5100 SAF is a microscope system. Olympus OLS 5100 SAF includes high magnification, differential interference contrast, laser scanning microscopy, a motorized stage, an anti-vibration desk, and computer/software.[1][2]

OLS 5100 SAF — Inventory photo
Fig. 01OLS 5100 SAFInventory photo[1]

What it is

The Olympus OLS 5100 SAF is a metrology and inspection microscope system.[2]

How it works

General reference — not yet source-verified

A microscope system in this class forms magnified images of a sample for inspection and measurement.

A laser scanning microscope scans a focused laser across the specimen and builds an image from the returned signal.

Where it fits in the process flow

The Olympus OLS 5100 SAF fits in metrology and inspection work rather than in wafer fabrication process steps.[2]

Applications

The Olympus OLS 5100 SAF is used for high-magnification inspection.[1][2]

The Olympus OLS 5100 SAF is used for laser scanning microscopy and differential interference contrast imaging.[1][2]

The Olympus OLS 5100 SAF is used with a motorized stage, anti-vibration desk, and computer software for inspection work.[1][2]

What do the numbers mean?

Optics & imaging4

High magnification[1]
Accurate?
Laser scanning microscopy (LSM)[1]
Accurate?
Magnification
high magnification[1]
Accurate?
Imaging
laser scanning microscopy (LSM)[1]
Accurate?

Control & software2

Computer and software[1]
Accurate?
Included
computer and software[1]
Accurate?

Configuration & options7

Differential interference contrast (DIC)[1]
Accurate?
Motorized stage[1]
Accurate?
Anti vibration desk[1]
Accurate?
Equipment type
microscope system[2]
Accurate?
Imaging
differential interference contrast (DIC)[1]
Accurate?
Stage
motorized stage[1]
Accurate?
Desk
anti-vibration desk[1]
Accurate?
Interested in this tool?
Need help with this tool?Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Not publicly documented

The following facts about the OLS 5100 SAF are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the OLS 5100 SAF are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the OLS 5100 SAF are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the OLS 5100 SAF are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the OLS 5100 SAF are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the OLS 5100 SAF is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]waferpedia.com — waferpedia.comwaferpedia.com
Was this page accurate?

Last updated Oct 4, 2026.

Compare with similar tools

View all →