KLA
The KLA Surfscan SP 1 DLS is a particle defect detection system for semiconductor wafers.[1][2][3][4][5]

Documented failure modes, common issues, and field considerations.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Surfscan SP 1 DLS Particle Defect System, 12 inch | — | 2002 | Listed as a 12-inch configuration with FOUP handler; one source describes it as non-operational, another notes Windows NT, two loadports, and input current details. | Equipment inventory listing[1] |
| Surfscan SP 1 DLS Particle Defect System, 8 inch | — | 2009 | Listed as an 8-inch configuration with a single-station FOUP handler and missing analog boards x2 and DC distribution board. | Equipment inventory listing[3] |
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The Surfscan SP 1 DLS is available in configurations for 200 mm (8 inch) and 300 mm (12 inch) wafers.[1][2][3][4]
The Surfscan SP 1 DLS runs on the Windows NT operating system.[2]
The following facts about the Surfscan SP 1 DLS Particle Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Surfscan SP 1 DLS Particle Defect are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the Surfscan SP 1 DLS Particle Defect is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Last updated Sep 25, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.