Gaertner
MI108
What it is
How it works
The MI108 uses the Schmaltz concept.[1][2]
The MI108 directs a narrow band of light through an adjustable slit and focuses the beam onto the test piece at a forty-five degree angle.[1]
The MI108 divides the light by the top and bottom surfaces of surface irregularities so the surface geometry can be viewed through the microscope eyepiece.[1]
The MI108 uses a filar micrometer with movable crosshairs to measure the difference between the two beams.[1]
Where it fits in the process flow
General reference — not yet source-verifiedThe MI108 belongs in surface metrology and inspection rather than in wafer fabrication or device processing.
The MI108 supports inspection after surface generation when the goal is to evaluate geometry, texture, and local features on a part.
Applications
The MI108 is used for studying fit and friction, wear and tear, surface contour, nicks, heights of burrs, depths of grooves, edge profile, thickness of anodized layers, coating thickness, and film profile.[1][2]
The MI108 is used for examining dimensional tolerances and surface quality.[1]
- Technical testing of surfaces
- Measurement of surface geometry
- Study of fit and friction
- Study of wear and tear
- Measurement of surface contour
- Measurement of nicks, burr heights, groove depths, and edge profile
- Measurement of thickness of anodized layers, coating thickness, and film profile
What do the numbers mean?
Optics & imaging4
Configuration & options6
- Standard equipment
- Base, filtered light source, adjustable slit, filar micrometer eyepiece with external revolution counter, x-y positioning stage with .001 reading micrometer thimbles, fixed angular mount, vertical positioning stage[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of microscope is the MI108?
The MI108 is a light-sectioning microscope.[1]
What measurement principle does the MI108 use?
The MI108 uses the Schmaltz concept and measures surface geometry with a filar micrometer.[1]
What light geometry does the MI108 use?
The MI108 uses a beam of light that intersects the surface at a forty-five degree angle.[1]
What are the standard equipment items for the MI108?
Standard equipment includes a base, filtered light source, adjustable slit, filar micrometer eyepiece with external revolution counter, x-y positioning stage with .001 reading micrometer thimbles, fixed angular mount, and vertical positioning stage.[1]
Not publicly documented
The following facts about the MI108 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MI108 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MI108 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MI108 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MI108 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MI108 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]web.archive.org — web.archive.orgweb.archive.org
- [2]MI108 — Gaertner | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 5, 2026.
Compare with similar tools
View all →The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
