Teradyne
The Teradyne Catalyst Tester is a semiconductor test system supporting 8-inch and 12-inch wafer sizes. A mixed-signal configuration of the Teradyne Catalyst Tester includes a Sun ULTRA60 tester computer with 256 MB RAM, a 200 MHz data rate, and 256 digital channels. The Teradyne Catalyst Tester's DC section provides 4-channel DC source matrix, 8-channel DC DUT source, and 48-channel AAPU pin.[1][2]

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The Catalyst tester supports wafer sizes of 8 inch and 12 inch.[1][10][3]
The tester computer is a Sun Ultra60 with 256 MB RAM, the user computer is a Sun Ultra5 with 256 MB RAM, the operating system is Solaris 5.5.1, and the test software is IMAGE revision 7.0 D8.[2]
The maximum power consumption is 31.6 KVA.[2]
The following facts about the Catalyst are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
The control-system platform and OS era of the Catalyst are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Catalyst are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Catalyst is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Catalyst are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the Catalyst are on record.
Answerable by: university cleanroom staff or an OEM application specialist
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Last updated Sep 27, 2026.
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