Advantest
C 400 E
What it is
The Advantest C 400 E is a test and probe system in semiconductor manufacturing.[2]
How it works
General reference — not yet source-verifiedA test and probe system makes electrical contact with device pads or probe points and routes signals through probe hardware to test electronics.
A test and probe system is used to apply stimulus, measure response, and separate functioning devices from failing devices before later assembly steps.
Where it fits in the process flow
General reference — not yet source-verifiedA test and probe system sits in the semiconductor inspection and test flow before package assembly.
A test and probe system is used after wafer fabrication and before downstream sorting, assembly, or final test operations.
Applications
What do the numbers mean?
Configuration & options31
- 512 pins[1]
- Digital Configure:[1]
- Analog: 231:MCA - Testhead: LTH - Cooler Type: E2760FA - Remark: XW4400 / 4G / 6.1.5/6.3.7/6.5.4 - HPIB: 1/0 - IP Address: 10.20.41.117 - Area: 4F-CP[1]
- DPS Power:[1]
- 10101-10216 | P1000| 2M | 112M | - 10301-10316 | P1000| 2M | 56M | - 10401-13216 | C400e| 2M | 56M |[3]
- Analog: 231:MCA - Testhead: LTH - Cooler Type: E2760DA - Remark: XW4400 / 4G / 6.1.5/6.3.7/6.5.4 - HPIB: 1/0 - IP Address: 10.20.41.112 - Area: 4F-CP[3]
- Digital Configure
- 10101-10216 | P1000 I 2M | 56M |; 10301-10516 | C400e I 2M | 56M |; 10601-10616 | P1000 I 2M | 56M |; 10701-10816 | C400e I 2M | 56M |; 10901-11216 | P1000 I 2M | 56M |; 11301-13216 | C400e I 2M | 56M |[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne Catalyst— Same function class: Test & Probe, nullCompare in depthsource[1]
- Teradyne Ultra Flex— Same function class: Test & Probe, nullCompare in depthsource[4]
- Teradyne Nextest Magnum 1 SV— Same function class: Test & Probe, nullCompare in depthsource[5]
- Teradyne ASM 3714— Same function class: Test & Probe, nullCompare in depthsource[6]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Advantest C 400 E Channel BoardIn Productionsource[7]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kind of equipment is the Advantest C 400 E?
The Advantest C 400 E is a test and probe system in semiconductor manufacturing.[2]
What does a test and probe system do?
A test and probe system makes electrical contact with device pads or probe points and routes signals through probe hardware to test electronics.[2]
Where does a test and probe system fit in the process flow?
A test and probe system sits in the semiconductor inspection and test flow before package assembly and is used after wafer fabrication and before downstream sorting, assembly, or final test operations.[2]
What application is the Advantest C 400 E used for?
The Advantest C 400 E is used for semiconductor device testing and probing.[2]
Not publicly documented
The following facts about the C 400 E are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the C 400 E are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the C 400 E are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the C 400 E are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the C 400 E are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the C 400 E is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (7)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]inventory listing
- [4]web.archive.orgweb.archive.org
- [5]waferpedia.comwaferpedia.com
- [6]waferpedia.comwaferpedia.com
- [7]Equipment inventory listing
Last updated Oct 8, 2026.
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