Waferpedia

KLA

Altair 8900 Defect

Altair 8900 Defect — Inventory photo
Fig. 01Altair 8900 DefectInventory photo[1]

What is it?

The KLA Altair 8900 Defect Inspection System is an 8-inch wafer defect inspection system described for CMOS image sensor applications.

What do the numbers mean?

Power & electrical3

Volts AC
208 V[1]
Accurate?
Amps
25[1]
Accurate?
Freq
50 / 60 Hz[1]
Accurate?

Wafer handling1

Wafer size
8 inch[1]
Accurate?

Configuration & options8

For CMOS Image Sensor Applications[1]
Accurate?
Module
Two Main Devices and a Set of UPS[1]
Accurate?
Power:[1]
Accurate?
Wires
5, Phases: 3[1]
Accurate?
Max AIC
10,000[1]
Accurate?
SCCR (A)
5,000[1]
Accurate?
Wires
5[1]
Accurate?
Phases
3[1]
Accurate?
Interested in this tool?
Need help with this tool?Embed spec card

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What wafer size does the KLA Altair 8900 support?

The Altair 8900 supports 8-inch (200 mm) wafers.[1][2]

What does the module configuration of the Altair 8900 include?

The module includes two main devices and a set of uninterruptible power supplies (UPS).[1][2]

Not publicly documented

The following facts about the Altair 8900 Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Altair 8900 Defect are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Altair 8900 Defect are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Altair 8900 Defect are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Altair 8900 Defect are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Altair 8900 Defect is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Altair 8900 Defect — KLA | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Was this page accurate?

Last updated Oct 8, 2026.

Compare with similar tools

View all →