JEOL
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The JEOL DA-1 is a prototype magnetic field-type electron microscope. The DA-1 was sold to Mitsubishi in 1947. The DA-1 was developed by the group that later founded JEOL.[1]
Introduced
1947
Node / era
Electron microscope
An electron microscope forms images by using an electron beam and electromagnetic lensing rather than visible light.
A transmission electron microscope sends electrons through a specimen to reveal internal structure at very small scales.
Electron microscopes in this class sit in metrology and inspection workflows where detailed imaging or structural observation is needed after sample preparation.
A transmission electron microscope is generally used for examination of thin specimens when internal features and fine structure matter more than surface-only inspection.
Process applications and technology nodes documented for this tool.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
No. Machines in this class are used to observe and measure rather than to modify the specimen.
The following facts about the DA-1 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the DA-1 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the DA-1 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the DA-1 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the DA-1 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No publicly documented compatible parts, consumables, or accessories for the DA-1 are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Last updated Oct 4, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.