Hitachi
The Hitachi S 4800 I is a scanning electron microscope (SEM). The Hitachi S 4800 I achieves a resolution of 1.0 nm at 15 kV accelerating voltage and 2.0 nm at 1 kV. The Hitachi S 4800 I offers magnification from 30x to 800,000x in high-magnification mode.[1]

The Hitachi S 4800 I is a scanning electron microscope used for metrology and inspection.[1]
The Hitachi S 4800 I includes a main body, a display unit with a PC, monitor, keyboard, and mouse, and a chiller as an option when no water source is present.[1]
A scanning electron microscope forms images by scanning a focused electron beam across a sample and collecting emitted signals from the interaction volume.
A scanning electron microscope uses electron optics, a vacuum column, and detectors to produce high-magnification images of surface features.
A scanning electron microscope sits in the inspection and metrology flow, where it is used to examine surfaces, measure fine structural features, and review process results after fabrication steps.
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The Hitachi S 4800 I is a scanning electron microscope.[1]
The following facts about the S 4800 I are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 4800 I are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the S 4800 I are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the S 4800 I are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the S 4800 I are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the S 4800 I is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 5, 2026.
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