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Bruker

Dektak 150 Surface

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This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Dektak 150 Surface — Inventory photo
Fig. 01Dektak 150 SurfaceInventory photo[1]

What it is

The Bruker Dektak 150 Surface is a surface profiler used in metrology and inspection.[5]

The Dektak 150 is a contact stylus profilometer for measuring surface profile and step height.[2][4]

How it works

The Dektak 150 measures step heights, surface roughness, surface topography, and waviness.[2][4]

Where it fits in the process flow

The Dektak 150 is used on samples up to six inches in dimension and up to four inches thick.[2]

Applications

The Dektak 150 is used for step-height measurement and surface roughness measurement in the nanometer range.[2]

The Dektak 150 is used to profile surface topography and waviness.[2]

What do the numbers mean?

Wafer handling1

Maximum substrate size
6 inch[2]
Accurate?

Optics & imaging2

Step-height repeatability
0.6 nm[2]
Accurate?
Vertical resolution
1 Ångström[3]
Accurate?

Dimensions & facilities2

Description
Advanced thin and thick film step height measurement tool[2]
Accurate?
Sample dimension
up to six inches in dimension[2]
Accurate?

Configuration & options13

Manufacturer
Bruker / Veeco[1]
Accurate?
Model
Dektak 150[1]
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Type
Surface profilometer[1]
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Measurement capabilities
Surface topography, waviness, and surface roughness[2]
Accurate?
Sample thickness
up to four inches thick[2]
Accurate?
Stage
Single-axis 4-inch Y auto stage[2]
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3D imaging
Enables mapping of 3D images[2]
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Vertical range
524 µm[3]
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Stylus radius
12.5 µm, 5.0 µm, 2.5 µm[3]
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Measurement method
Contact stylus[4]
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Maximum sample size
150 mm (6-inch)[4]
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Scan length
55 mm[4]
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Optional vertical range
1 mm[4]
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of measurement does the Dektak 150 perform?

The Dektak 150 performs thin and thick film step-height measurement.[2]

What sample size can the Dektak 150 handle?

The Dektak 150 can measure samples up to six inches in dimension and up to four inches thick.[2]

What is the maximum substrate size mentioned for the Dektak 150?

The maximum substrate size is 6 inch.[2]

What vertical performance figure is given for the Dektak 150?

The system provides a step-height repeatability of 0.6 nm.[2]

Not publicly documented

The following facts about the Dektak 150 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Dektak 150 Surface are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Dektak 150 Surface are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Dektak 150 Surface are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Dektak 150 Surface are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Dektak 150 Surface is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]nnci.net — nnci.netnnci.net
  3. [3]nuance.northwestern.edunuance.northwestern.edu
  4. [4]directadvop.com — directadvop.comdirectadvop.com
  5. [5]Dektak 150 Surface — Bruker | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
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Last updated Oct 8, 2026.

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