Comparison ledger
Advantest T 5377, Advantest T 5377 S, Advantest T 5377 S Memory, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5377Advantest | T 5377 SAdvantest | T 5377 S MemoryAdvantest |
|---|---|---|---|
| OEM | Advantest | Advantest | Advantest |
| Category | Test & Probe | Test & Probe | Test & Probe |
| Wafer size | — | — | — |
| Process node | — | — | — |
| Introduced | — | — | — |
| Production run | — | — | — |
| Lifecycle | — | — | — |
| Lifecycle milestones | — | — | — |
| Control system | — | — | — |
| Generation | — | — | — |
| Family | Advantest T 5377 | Advantest T 5377 | Advantest T 5377 |
| Cited variants | — |
| — |
| Specifications | |||
| Configuration | Dual Test Head[2] | 2048DR +1280 I/O[4] | 3 Wire[5] |
| Test speed (single data rate) | 143 MHz[3] | — | — |
| Test speed (DDR mode) | 286 MHz[3] | — | — |
| Maximum number of devices tested in parallel | 256 DUTs per system[3] | — | — |
| Number of test heads | Up to 2 stations[3] | — | — |
| DC units per station | Up to 64[3] | — | — |
| Programmable loads per station | Up to 256[3] | — | — |
| Options | MRA4 or AFM[3] | — | — |
| Target devices | DRAM, SDRAM, DDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, mask ROM[3] | — | — |
| Wafer size support | 300 mm[3] | — | — |
| Memory capacity | — | 16G FMRA[4] | — |
| Handler interface | — | WMB Hifix[4] | — |
| Vintage | — | 2006, 2007[4] | 2005[5] |
| Digital Resources (DR) | — | 2048[4] | — |
| I/O channels | — | 1280[4] | — |
| FMRA | — | 16G[4] | — |
| Hifix | — | WMB[4] | — |
| Vintage years | — | 2006, 2007[4] | — |
| Product category | — | Memory Test System[1] | — |
| Phase | — | — | 3 Phase[5] |
| Voltage | — | — | 208V[5] |
| Power Configuration | — | — | 3 Phase, 3 Wire[5] |
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