Advantest
T 5377
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
The T 5377 supports DRAM, SDRAM, ADDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, and mask ROM.[2]
Where it fits in the process flow
General reference — not yet source-verifiedThe T 5377 fits in semiconductor electrical test and wafer probing flows.
A probe system generally sits after front-end device formation and before final package-level or system-level qualification.
Applications
The T 5377 is used for memory devices including DRAM, SDRAM, ADDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, and mask ROM.[2]
What do the numbers mean?
Power & electrical2
Wafer handling1
Optics & imaging1
- Target devices
- DRAM, SDRAM, DDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, mask ROM[2]
Configuration & options6
- Dual Test Head[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Advantest T 5581 / T 5375 / T 5377 BoardIn Productionsource[3]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How does a memory tester differ from a logic tester?General reference — not yet source-verified
Memory testers are optimized for testing dense arrays of memory cells with repetitive patterns, while logic testers focus on testing digital logic devices with complex state machines and interfaces. Memory testers typically have many more parallel test channels for addressing multiple memory cells simultaneously, and are designed for the specific timing and voltage requirements of memory devices.
What is the typical test throughput for a system like this?General reference — not yet source-verified
Throughput varies widely based on device complexity, test program length, and parallel test site count. Memory testers can test multiple devices in parallel (site-parallel testing), and throughput is measured in devices per hour. Higher parallel test capability and faster pattern execution directly improve throughput.
What kind of facility infrastructure does a memory tester require?General reference — not yet source-verified
Such systems require cleanroom or controlled lab environments with stable temperature and humidity, adequate electrical power (often three-phase), cooling water circulation, and compressed air. The exact specifications depend on the tester's power consumption and thermal management needs.
Can this tester be used for wafer-level testing?General reference — not yet source-verified
Yes, memory testers of this class are commonly used for wafer sort testing when paired with a prober (a wafer-handling system that steps through individual die). The tester provides the electrical interface to the probe card that contacts the bond pads on each die.
Not publicly documented
The following facts about the T 5377 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5377 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 5377 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 5377 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 5377 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 5377 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]web.archive.org — advantest.co.jp (Jun 7, 2007)web.archive.org
- [3]Equipment inventory listing
Last updated Sep 28, 2026.
