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Comparison ledger

R50versusArcher 10 XT Overlay

Filmetrics R50, KLA Archer 10 XT Overlay, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
R50Filmetrics
OEMFilmetricsKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mm200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyFilmetrics R50KLA Archer
Specifications
Default configurationconfigured by default for metallic layers[1]—
Default sample thickness525 um +/- 25 um[1]—
Equipment sectionMetrology[1]—
Related equipment on same page groupAIT CMT-SR2000N 4-Point Probe Measurement System; MPI TS150 Probe Station[1]—
Measurement type4-point probe[1]—
Default materialmetallic layers[1]—
Configuration—During refurbishment the loadports were replaced with the cassette loader that is shown in our video below[2]
Wafer size—200mm dual port open wafer handler[2]
OEM—KLA[3]
Model—Archer 10 XT Overlay[3]
Category—Metrology & Inspection[3]
Description—200mm overlay metrology system[3]
Software version—5.6[2]
Wafer handler—200mm dual port open wafer handler[2]
Chuck—8" chuck[2]
Computer upgrade—XP computer upgrade[2]
Computer—KLASS RS2 computer[2]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]inventory listing
  3. [3]waferpedia.comwaferpedia.com