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Lam Research

4520 Oxide

EtchLam Research Rainbow 4520 family
Research Quality: 50% complete
4520 Oxide — Inventory photo
Fig. 014520 OxideInventory photo[1]

Power

PDW 2200[1]

Performance

≥ 4500 A/min[3]

Gas delivery

Orbital Welded[1]

Optics

Monochrometer (405/520 nm)[1]

What it is

The Lam Research 4520 Oxide Etch is a cluster plasma tool configured for 200 mm wafers. The system can be converted to run either 150 mm or 200 mm wafers. The system operates with 208 V, three-phase, 60 Hz power and requires 175 A. The tool uses a bulkhead mounting configuration.[1][7][2][4][3]

How it works

The Lam Research 4520 uses a parallel plate reactor with an inductive RF auto-tuning system. The system employs a low-pressure main chamber for anisotropic etching of dielectric films. The tool includes a moving gap between the upper and lower electrodes for process flexibility. The system uses a pick-and-place wafer transport system with non-wafer contact optical alignment and flat/notch orientation. Active temperature control is applied to both upper and lower electrodes. Wafer clamping uses an electrostatic chuck (ESC) with closed-loop backside helium cooling.[1][7][3]

The system includes an enhanced Monochromator endpoint detector operating at wavelengths of 405 nm and 520 nm for automatic endpoint on exposed oxide. The RF power is supplied by a PDW 2200 watt generator with a LOFAT RF match. The gas delivery uses an orbital-welded gas box with mass flow controllers. Gas configuration includes lines for argon, nitrogen, oxygen, methane, CHF3, and SF6. The system uses HINE indexers for wafer handling.[1][7][4]

Applications

The Lam Research 4520 is used for dielectric etch applications including contact etch, planarization, via etch, trench mask etch, and pad etch. The system is specified for etching 0.5 µm contact holes and above at aspect ratios of less than 4:1. The tool can etch thermal oxide at rates of 4500 Å/min or higher, BPSG at rates above 7500 Å/min, and TEOS at rates above 5000 Å/min with uniformity of +/- 10% across the wafer. Selectivity of BPSG or TEOS to polysilicon is greater than 15:1. Particle performance is less than 0.08 particles per square centimeter for particles greater than 0.3 µm in size.[3]

The system uses a low polymer forming chemistry to achieve high selectivity to polysilicon. Process gases available include argon, CF4, CHF3, O2, CO, SF6, and N2. The tool is capable of processing wafers with dimensions from 150 mm up to 200 mm.[2][3]

What do the numbers mean?

Power & electrical7

Generator
PDW 2200[1]
Accurate?
RF MAtch LOFAT[1]
Accurate?
Generator
PDW 2200 watt RF generator[1]
Accurate?
RF Match
LOFAT[1]
Accurate?
Power Requirements
208 V, 50 A, 50/60 Hz[2]
Accurate?
RF Generator
PDW 2200 (2200 watt)[1]
Accurate?
Power Requirements
208 V, 50 A, 50/60 Hz (per unit listing)[2]
Accurate?

Wafer handling4

Indexers
HINE[1]
Accurate?
Wafer Size
200 mm (8 inch) standard, optional 150 mm (6 inch) and 125 mm (5 inch)[1]
Accurate?
Clamping
ESC (Electrostatic Chuck)[1]
Accurate?
Wafer Size
200 mm (8 inch); optional 150 mm (6 inch) and 100 mm (4 inch)[4]
Accurate?

Gas & chemistry12

Gas Box
Orbital Welded[1]
Accurate?
Gas Config:[1]
Accurate?
Gas 1
Ar 1000[1]
Accurate?
Gas 2
N2 200[1]
Accurate?
Gas 3
O2 200[1]
Accurate?
Gas 4
CH4 200[1]
Accurate?
Gas 5
CHF3 50[1]
Accurate?
Gas 6
SF6 50[1]
Accurate?
Gas Configuration (example)
Gas 1: Ar 1000 sccm, Gas 2: N2 200 sccm, Gas 3: O2 200 sccm, Gas 4: CH4 200 sccm, Gas 5: CHF3 50 sccm, Gas 6: SF6 50 sccm, Gas 7: O2 1000 sccm[1]
Accurate?
Gas 7
O2 1000[1]
Accurate?
Gas Configuration (example)
Ar 1000 sccm, N2 200 sccm, O2 200 sccm, CH4 200 sccm, CHF3 50 sccm, SF6 50 sccm, O2 1000 sccm[1]
Accurate?
Process Gas Types (available)
Ar, CF4, CHF3, O2, CO, SF6, N2, Cl2, HBr, CH3F, He, CH2F2[2]
Accurate?

Optics & imaging1

Endpoint
Monochrometer (405/520 nm)[1]
Accurate?

Performance8

Thermal Oxide Etch Rate
≥ 4500 A/min[3]
Accurate?
BPSG Etch Rate
> 7500 A/min[3]
Accurate?
TEOS Etch Rate
> 5000 A/min[3]
Accurate?
Uniformity
+/- 10% 3σ[3]
Accurate?
Thermal Oxide Etch Rate
≥ 4500 Å/min[3]
Accurate?
BPSG Etch Rate
> 7500 Å/min[3]
Accurate?
TEOS Etch Rate
> 5000 Å/min[3]
Accurate?
Uniformity (3σ)
± 10%[3]
Accurate?

Control & software2

Software
Envision 1.52[1]
Accurate?
Software Revision
Envision 1.52[1]
Accurate?

Dimensions & facilities4

Dimensions (Width x Depth x Height)
47.244 in x 98.425 in x 66.929 in (120.0 cm x 250.0 cm x 170.0 cm)[2]
Accurate?
Weight
1,764 lb (800 kg)[2]
Accurate?
Exterior Dimensions (W x D x H)
120.0 cm x 250.0 cm x 170.0 cm[2]
Accurate?
Weight
800 kg (1,764 lb)[2]
Accurate?

Configuration & options18

Refurbished[1]
Accurate?
Can convert to 6 or 8 system[1]
Accurate?
Mounting
Bulkhead[1]
Accurate?
AC Box
-002[1]
Accurate?
Clamping
ESC[1]
Accurate?
Backside Helium
Closed Loop[1]
Accurate?
Endpoint
Monochrometer[1]
Accurate?
MFCs
Unit 1660[1]
Accurate?
Uptime
≥ 85%[3]
Accurate?
MTTC (Mean Time to Clean)
< 6 hours[3]
Accurate?
MTBF (Mean Time Between Failures)
≥ 125 hours[3]
Accurate?
MTTR (Mean Time to Repair)
≤ 4 hours[3]
Accurate?
Selectivity (BPSG/TEOS to poly)
> 15:1[3]
Accurate?
Particles
< 0.08/cm2 at >0.3μm[3]
Accurate?
Year of Manufacture (example)
1996[2]
Accurate?
Backside Helium Cooling
Closed loop[1]
Accurate?
Endpoint Detection
Monochrometer (enhanced Monochromator for automatic endpoint on exposed oxide)[1]
Accurate?
Uptime (typical)
≥ 85%[3]
Accurate?
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What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Gas BoxOrbital Welded[1]
  • GeneratorPDW 2200[1]
  • ConfigurationRF MAtch LOFAT[1]
  • ConfigurationGas Config:[1]
  • Gas 1Ar 1000[1]
  • Gas 2N2 200[1]
  • Gas 3O2 200[1]
  • Gas 4CH4 200[1]
  • Gas 5CHF3 50[1]
  • Gas 6SF6 50[1]
  • GeneratorPDW 2200 watt RF generator[1]
  • RF MatchLOFAT[1]
  • Gas Configuration (example)Gas 1: Ar 1000 sccm, Gas 2: N2 200 sccm, Gas 3: O2 200 sccm, Gas 4: CH4 200 sccm, Gas 5: CHF3 50 sccm, Gas 6: SF6 50 sccm, Gas 7: O2 1000 sccm[1]
  • Power Requirements208 V, 50 A, 50/60 Hz[2]
  • Gas 7O2 1000[1]
  • RF GeneratorPDW 2200 (2200 watt)[1]
  • Gas Configuration (example)Ar 1000 sccm, N2 200 sccm, O2 200 sccm, CH4 200 sccm, CHF3 50 sccm, SF6 50 sccm, O2 1000 sccm[1]
  • Process Gas Types (available)Ar, CF4, CHF3, O2, CO, SF6, N2, Cl2, HBr, CH3F, He, CH2F2[2]
  • Power Requirements208 V, 50 A, 50/60 Hz (per unit listing)[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What type of endpoint detection does the 4520 use?

The system uses a monochrometer for automatic endpoint detection.[1][7][3]

What is the typical etch rate for thermal oxide on the 4520?

The thermal oxide etch rate is at least 4500 Å/min.[3]

What software revision does the 4520 system use?

Configured systems use Envision software version 1.52 or revision E1.7-024.[1][7][2]

What RF generator is used in the Lam 4520?

The system uses a PDW 2200 watt RF generator.[1][4][7]

Not publicly documented

The following facts about the 4520 Oxide are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4520 Oxide are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 4520 Oxide are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 4520 Oxide are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 4520 Oxide are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 4520 Oxide is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]surplus.infineon.com — surplus.infineon.comsurplus.infineon.com
  3. [3]cdn2.hubspot.net — cdn2.hubspot.netcdn2.hubspot.net
  4. [4]solutions-on-silicon.com — solutions-on-silicon.comsolutions-on-silicon.com
  5. [5]Equipment inventory listing
  6. [6]waferpedia.comwaferpedia.com
  7. [7]LAM 4520 Oxide Etch System &#8211; JTM Technologies, Inc. — jtmtechnologies.comjtmtechnologies.com
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Last updated Sep 24, 2026.

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