FormFactor
Provisional entry — research in progress
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FormFactor CM 300 xi is a 300 mm semi-/fully-automated probe station. FormFactor CM 300 xi supports Contact Intelligence for autonomous semiconductor test. FormFactor CM 300 xi can handle up to fifty 200 mm or 300 mm wafers in SEMI-standard wafer cassettes.[1]
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| CM300xi-ULN | — | — | Ultra low noise version for flicker noise, RTN or RTS, and phase noise measurements. | formfactor.com[3] |
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The following facts about the CM 300 xi are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the CM 300 xi are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the CM 300 xi are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the CM 300 xi are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the CM 300 xi is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the CM 300 xi are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 7, 2026.