Advantest
V 93000 C (2 CC) DUT Test Head
The Advantest V 93000 C (2 CC) DUT Test Head is a device-under-test (DUT) test head. The V 93000 C (2 CC) DUT Test Head uses digital cards (HSM8G) and digital pogos (HD256). The V 93000 C (2 CC) DUT Test Head includes DPS cards (DCS-DPS32, DCS-VI32, MSDPS).[1][2][3][4]
What is it?
Applications
What do the numbers mean?
Control & software4
Configuration & options21
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Rev 004 | — | — | Includes HSM8G x2, HD256 x2, DCS-VI32 x1, DCS-DPS32 x1, MSDPS x1 (some variants), CTH engineering cart, control workstation | Equipment inventory listing[3] |
| Rev 005 | — | — | Includes HSM8G x3, HD256 x3, DCS-VI32 x1, CTH engineering cart, control workstation | Equipment inventory listing[4] |
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is a DUT test head used for?General reference — not yet source-verified
It provides the physical and electrical interface that connects a semiconductor tester to the device under test so automated measurements can be performed.
Is this the tester itself?General reference — not yet source-verified
No. It is the interface hardware used with a tester, not the test program or measurement instrument set by itself.
What kinds of tests does this class support?General reference — not yet source-verified
Machines of this class are generally used for electrical test activities such as functional checks, parametric measurements, and production screening.
Where does this equipment fit in semiconductor manufacturing?General reference — not yet source-verified
It is used in the test stage, after device fabrication and preparation, as part of the final verification flow before downstream handling.
Why is a dedicated test head needed?General reference — not yet source-verified
A dedicated test head helps maintain stable contact, organized signal routing, and repeatable electrical conditions between the tester and the device under test.
Not publicly documented
The following facts about the V 93000 C (2 CC) DUT Test Head are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 C (2 CC) DUT Test Head are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the V 93000 C (2 CC) DUT Test Head are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the V 93000 C (2 CC) DUT Test Head are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the V 93000 C (2 CC) DUT Test Head is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the V 93000 C (2 CC) DUT Test Head are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]inventory listing
- [4]inventory listing
Last updated Oct 3, 2026.
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