Accretech
UF 3000
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Accretech UF 3000 is a wafer prober for testing integrated circuits on wafers. The Accretech UF 3000 supports tri-temp operation with a temperature range of -40 to 150°C. The Accretech UF 3000 is manufactured by Accretech, which is located in Tokyo, Japan.[1][2]
What it is
How it works
General reference — not yet source-verifiedA prober positions a wafer on a movable chuck and brings it into alignment with a probe card, which contains an array of fine probes that make electrical contact with the wafer's bond pads.
Where it fits in the process flow
General reference — not yet source-verifiedThe UF 3000 is used in the wafer sort (also called die sort or probe) stage of semiconductor manufacturing, which occurs after wafer fabrication and before assembly and packaging.
During wafer sort, the prober works in conjunction with a semiconductor test system (automated test equipment) to electrically test each die on the wafer, identifying known good dies (KGD) and eliminating defective ones.
Applications
General reference — not yet source-verifiedThe UF 3000 is applied in the electrical testing of integrated circuits at the wafer level, across a wide range of device types and technologies.
What do the numbers mean?
Configuration & options6
- Tri-Temp[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the UF 3000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UF 3000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UF 3000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UF 3000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the UF 3000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the UF 3000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]KR101181639B1 - Apparatus for planarizing a probe card and method using same - Google Patents — patents.google.compatents.google.com
- [3]Equipment inventory listing
- [4]Equipment inventory listing
Last updated Oct 1, 2026.
