Waferpedia

Tool family

KLA Archer 10

KLA1 entry

Models in this family

  1. The KLA Archer 10 is an automated overlay registration measurement system that uses a coherence probe interference microscope.

    Cited variants

    DesignationGenerationVintageChangesSource
    Archer 10 XT Overlay——Refurbishment-upgraded components and software version 5.6; XP computer upgrade; KLASS RS2 computer; 5 AMS; digitizer; LINNIK; PDA; PZT-P-Z feedbackwaferpedia.com[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com