Bruker Dimension

Models in this family

1. 

   Dimension 3100

   The Bruker / Veeco Dimension 3100 is an atomic force microscope (AFM) used for surface topography measurement on wafers up to 8 inches.

2. 

   Dimension Fastscan

   The Bruker / Veeco Dimension Fastscan is an atomic force microscope with stated scan, noise, stage, optics, software, and AFM mode specifications.

3. 

   Dimension Vx 210 Atomic Force Profiler

   The Bruker / Veeco Dimension Vx 210 is an Atomic Force Profiler (AFP) for 8-inch wafers.

4. 

   Dimension Vx 330

   Bruker Dimension Vx 330 is an atomic force microscope in the Metrology & Inspection category.

5. Dimension X 3 D