Waferpedia

Comparison ledger

NGP80versus980

Oxford Instruments NGP80, Tegal 980, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
NGP80Oxford Instruments
980Tegal
OEMOxford InstrumentsTegal
CategoryEtchEtch
Wafer size200mm200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyOxford Instruments NGP80Tegal 980
Cited variants
Specifications
Equipment nameOxford NGP80 RIE[3]—
ModelNGP80[4]—
Configuration optionsRIE, PECVD, RIE/PECVD[4]—
Wafer sizeup to 200 mm[4]200mm[2]
Electrode diameter240 mm[1]—
RF power300 W[5]—
Substrate temperature range (standard)5-80 °C[5]—
Substrate temperature (max)400 °C[4]—
Cryogenic temperature optiondown to -150 °C[1]—
Base pressure≤5×10⁻⁷ mbar[4]—
Process pressure range10 mTorr to 10 Torr[4]—
Gas species (RIE variant)O2, CF4, SF6, Ar, CHF3, N2[5]—
Chuck materialgraphite[5]—
Process TypeReactive Ion Etch (RIE)[5]—
Wafer Handlingpieces (unmounted), 100 mm, 150 mm[5]—
Chuck Temperature Range5–80 °C[5]—
Gas SpeciesO2, CF4, SF6, Ar, CHF3, N2[5]—
Locationroom W1-062[6]—
Series name—980 ACS Series[2]
Process type—Plasma etch[2]
System type—Single wafer cassette-to-cassette etch system[2]
Throughput—Faster throughput[2]
Calibration—Faster system calibration[2]
User interface—Touchscreen graphical user interface[2]
Data handling—Integrated data logging[2]
Factory automation—Factory automation support[2]
Tool format—Single wafer cassette-to-cassette etch system[2]
System calibration—Faster system calibration[2]
Automation—Factory automation support[2]

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Sources (6)Every fact above is drawn from these public sources
  1. [1]scribd.comscribd.com
  2. [2]web.archive.orgweb.archive.org
  3. [3]confluence.nanofab.ualberta.caconfluence.nanofab.ualberta.ca
  4. [4]instrumenthive.cominstrumenthive.com
  5. [5]confluence.nanofab.ualberta.caconfluence.nanofab.ualberta.ca
  6. [6]waferpedia.comwaferpedia.com