Waferpedia

Comparison ledger

X-Series LX 20 ATEversusX-Series MX

LTX-Credence X-Series LX 20 ATE, LTX-Credence X-Series MX, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
X-Series LX 20 ATELTX-Credence
X-Series MXLTX-Credence
OEMLTX-CredenceLTX-Credence
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyLTX-Credence X-SeriesLTX-Credence X-Series
Specifications
ConfigurationWith Docking and Manipulator from Turbodynamics[1]slot1: STEPBUSⅡ_ADAP_NEW[2]
Slot 1Instrument: SSBA[1]—
Slot 2Instrument: OVI[1]—
Slot 3instrument: Empty[1]—
Slot 4Instrument: DCTM[1]—
Slot 5Instrument: Empty[1]—
Slot 6Instrument: Empty[1]—
Slot 7Instrument: QFVI[1]—
Slot 8Instrument: HEXVI 16[1]—
Slot 9Instrument: AWG_HR[1]—
Slot 10Instrument: Empty[1]—
Slot 11Instrument: QFVI[1]—
Slot 12Instrument: Empty[1]—
Slot 13Instrument: Empty[1]—
Slot 14Instrument: Empty[1]—
Slot 15Instrument: FX 1_PEC[1]—
Slot 16Instrument: FX 1_PEC[1]—
Slot 17Instrument: FX_TMBD[1]—
Slot 18Instrument: FX 1_PEC[1]—
Slot 19Instrument: FX 1_PEC[1]—
Tester OS—Unison 4.2.0[2]
Tester PC—PC-X1[2]
slot2—OCTAL_VI[2]
slot3—HCOVI[2]
slot4—DCTM[2]
slot6—HVVI[2]
slot8—QFVI_VI[2]
slot9—QTMP[2]
slot10—SWGHSB[2]
slot12—DIGHSB[2]
slot14—HEX_VI[2]
slot15—TH_PECFX2[2]
slot16—TH_PECFX2[2]
slot17—TH_THBDFX_DIR_TMP_REFCLK[2]
slot18—TH_PECFX2[2]
slot19—TH_PECFX2[2]
slot20—HEX_VIB[2]
slot33—STEPBUSⅡ_ADAP_NEW[2]
slot34—OCTAL_VI[2]
slot1—STEPBUSⅡ_ADAP_NEW[2]
slot49—TH_THBDFX_DIR_TMP_REFCLK[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing