Comparison ledger
KLA .498 PSL Wafer, Zygo Newview 100 Optical Surface, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Zygo |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Zygo Newview |
| Specifications | ||
| Configuration | NIST Traceable[1] | 40x objective[2] |
| NIST traceability | Yes[1] | — |
| Manufacturer | — | Zygo[2] |
| Model | — | Newview 100[2] |
| Type | — | Optical Surface Profilometer[2] |
| Objectives | — | 40x objective, 10x objectives[2] |
| Software | — | Metro-pro software[2] |
| Vintage | — | 1996[2] |
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