Comparison ledger
Electroglas EG 4090 u Automatic Wafer, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4090 u Automatic WaferElectroglas | 1007KLA |
|---|---|---|
| OEM | Electroglas | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | Wafer Profiler Kit | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4090 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | For Parts[2] | — |
| Temperature Range | Ambient ~ +130 degree C[1] | — |
| Wafer size | Wafer Profiler Kit[1] | 150 mm[4] |
| Voltage | 220VAC, 50 / 60 Hz & Single Phase Input Voltage[1] | — |
| Type | Automatic Wafer Prober[3] | — |
| Wafer Stage Size | 8 inch X-Y Stage[1] | — |
| Hot Chuck Size | 8 inch Standard Hot Chuck Top Assy[1] | — |
| Hot Chuck Temperature Range | Ambient ~ +130°C[1] | — |
| Vision Module | Dual Optic Bridge CCD Camera Assembly[1] | — |
| Wafer Profiler Kit | Included[1] | — |
| Ring Carrier Plate | RC 2[1] | — |
| Probe Card Holder | RTGR 2[1] | — |
| Cassette Loader | Right Side Single Cassette Loader[1] | — |
| Control Module | Display Control Module with Windows EGC Version 7 or Higher[1] | — |
| Display | LCD Touch Screen Monitor[1] | — |
| Z-Stage | PZ 7 Z-Stage, 0.125 MIL or 0.25 MIL Z Resolution[1] | — |
| Alignment | PTPA (Probe to Pad Alignment), PTPO[1] | — |
| Interfaces | RS 232, GPIB & TTL Tester Interface[1] | — |
| Input Voltage | 220VAC, 50/60 Hz, Single Phase[1] | — |
| Scrub Pad | Included[1] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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