Comparison ledger
Applied Materials 0720 06060 Part, Multitest MT 9928, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | MT 9928Multitest |
|---|---|---|
| OEM | Applied Materials | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Multitest MT 9928 |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | No change kit[2] |
| Type | — | Gravity DUT handler[3] |
| Number of sites | — | Octal (8 parallel contact sites)[3] |
| Temperature capability | — | Tri-temp[3] |
| Throughput | — | Up to 28,000 uph[3] |
| Standard package support | — | SOICs from MSOP118 to SO430; QFN from 2mm x 2mm to 11mm x 11mm[3] |
| Bowl feeder package support | — | SOT223, SOT23, and small MLF 3x3 packages[3] |
| Loader/unloader configuration | — | Standard tube or metal magazine loader/unloader[3] |
| Contactors | — | DURA contactors available[3] |
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