Comparison ledger
Applied Materials 0720 06060 Part, Espec EHS-432(M)-L, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | EHS-432(M)-LEspec |
|---|---|---|
| OEM | Applied Materials | Espec |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Espec EHS-432(M)-L |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | — |
| Category | — | Large highly accelerated stress test system[2] |
| Model | — | EHS-432(M)-L[2] |
| Temperature range | — | +105.0°C to +162.2°C[2] |
| Humidity range | — | 75%rh to 100%rh[2] |
| Pressure range | — | 0.0196 MPa to 0.392 MPa gauge[2] |
| Interior dimensions | — | φ560×L 760 mm[2] |
| Capacity | — | 180 L[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →