Comparison ledger
Agilent 11980 A, Wyko 400, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | 400Wyko |
|---|---|---|
| OEM | Agilent | Wyko |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Wyko 400 |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| Type | — | Laser interferometer[2] |
| Test aperture | — | 100 mm (4 in.)[2] |
| Zoom | — | Full 6X zoom[2] |
| Display/output | — | Live fringe output[2] |
| Alignment system | — | Simple twin spot alignment system[2] |
| Measurement capability | — | Phase shifting capability[2] |
| Wavelength sources | — | 633 nm or 1.06 µm[2] |
| Optional apertures | — | 25.4 mm (1 in.) and 152.4 mm (6 in.)[2] |
| Accuracy | — | Peak-to-valley accuracy of l/100[2] |
| Repeatability | — | l/300[2] |
| Accuracy (peak-to-valley) | — | λ/100[3] |
| Output | — | live fringe output[3] |
| Phase shifting capability | — | yes[3] |
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