Waferpedia

Comparison ledger

11980 Aversuscontour-R1

Agilent 11980 A, Bruker contour-R1, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
11980 AAgilent
OEMAgilentBruker
CategoryPrecision OpticsPrecision Optics
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAgilent 11980 ABruker contour-R1
Specifications
Wavelength Range1250-1600 nm[1]—
Equipment type—Optical Profiler[2]
Equipment identifier—Inert-BRUKER-contour-R1[2]
Measurement principle—Optical (non-contact) 3D surface characterization; uses interference microscopy[3]
Vertical resolution (VSI mode)—~3 nm[3]
Vertical resolution (PSI mode)—<0.1 nm[3]
Max. sample height—100 mm[3]
Max. sample diameter—150 mm[3]
Max. single measurement area—1.0 mm x 1.0 mm (with stitching for larger areas)[3]
Measurement modes—Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI)[3]
Objectives—10X and 50X on a software controlled motorized turret[3]
Field of view (FOV) lens—0.55X and 2X[3]
Stage type—Motorized X-Y stage[3]
Software—Vision64 for automation and analysis[3]
Additional capabilities—Stitching algorithm for combining multiple images; handles rough surfaces, abrupt steps, slopes >60°, and low reflectance <0.5%[3]
Vendor—Bruker[3]
Model—Contour Elite I 3D optical metrology system[3]
Purpose—Optical (non-contact) 3D surface characterization of a wide range of substrates and devices[3]
Description—Optical profiler capable of generating three dimensional surface scans of a wide range of materials and devices[3]
Stage—Motorized X-Y stage positioning[3]
Maximum sample size—150 mm diameter[3]
Maximum sample height—100 mm[3]
FOV lenses—0.55X and 2X[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]uwaterloo.cauwaterloo.ca
  3. [3]uwaterloo.cauwaterloo.ca