Comparison ledger
Advantest T 5581 P Memory, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5581 P MemoryAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5581 | KLA 1007 |
| Specifications | ||
| Configuration | Tester Mainframe:[1] | — |
| OEM | Advantest[1] | — |
| Model | T 5581 P Memory[1] | 1007[3] |
| Description | Memory Test System[2] | Wafer Prober[3] |
| Tester mainframe | High-speed test vector transfer bus and high-speed tester control bus for data transfer; algorithmic pattern generator (ALPG); programmable data selector (PDS); timing generator; failure analysis memory; format control and digital compare; DC parametric test unit; programmable power supplies for devices[1] | — |
| Manufacturer | — | KLA[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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