Comparison ledger
Advantest T 5372, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5372Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5372 | KLA 1007 |
| Specifications | ||
| Configuration | Parts machines[1] | — |
| Test speed | 143MHz/286MHz (DDR mode)[3] | — |
| Max test pins | 128 (64×2 stations ×8/×9 bit)[3] | — |
| Max test heads (stations) | 2[3] | — |
| DC units per station | 32[3] | — |
| Programmable loads per station | 128[3] | — |
| Options | MRA4 ev2, FM, Fail Bit Compress Engine[3] | — |
| Supported devices | DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, Mask ROM, etc.[3] | — |
| Maximum pins | 128 (64 x 2 stations x 8/9 bit)[3] | — |
| Maximum test head stations | 2[3] | — |
| High voltage/drive (DC nets per station) | 32 max[3] | — |
| Programmable power supplies per station | 128 max[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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