Waferpedia

Comparison ledger

.498 PSL WaferversusSTM 7 MF Measuring

KLA .498 PSL Wafer, Olympus STM 7 MF Measuring, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAOlympus
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .498 PSL WaferOlympus STM 7 MF Measuring
Specifications
ConfigurationNIST Traceable[1]—
NIST traceabilityYes[1]—
Vertical movement range—175 mm[2]
Maximum measurable height—120 mm (with measurement objective), 175 mm (with metallurgical objective)[2]
Z-axis measurement resolution—0.1 μm[2]
Z-axis drive method—Manual coaxial fine/coarse focusing knobs[2]
Illumination—LED illumination; white for reflected light, green for transmitted light[2]
Observation tube—Erect image monocular tube, erect image trinocular tube (100:0/0:100)[2]
Objective—For measuring microscope MM6-OB series; for metallurgical microscope MPLFLN series, LMPLFLN series, MPLFLN-BD series, LMPLFLN-BD series[2]
Eyepiece—MM6-OCC10X (with cross hairs, FN 22), MM6-OC10X (FN 22)[2]
Stage measuring range (STM7-CS200)—X-axis 200 mm, Y-axis 200 mm[2]
Measurement accuracy (L: measuring length)—(3+4L/200) μm[2]
Accuracy assurance weight—10 kg[2]
Number of axes (counter display)—Three[2]
Units (counter display)—mm/μm/inch/mil[2]
Minimum resolution (counter display)—0.1 μm[2]
Dimensions (W x D x H)—606 x 762 x 651 mm[2]
Weight—152 kg (approx.)[2]
Power consumption—100-120/220-240V ~ 50/60Hz 0.3A/0.2A[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]viontecmall.comviontecmall.com