Comparison ledger
KLA .204 PSL Wafer, Onto Innovation IVS 380 System, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | IVS 380 SystemOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | 300mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Onto Innovation IVS 380 System |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[1] | — |
| Traceability | NIST[2] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[1] | — |
| Wafer size | — | 300mm[3] |
| Metrology capabilities | — | Overlay, CD, height[3] |
| Metrology types | — | overlay, CD, and height metrology[3] |
| Target markets | — | advanced packaging, compound semiconductor, power devices, RF, MEMS, and LED markets[3] |
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