Comparison ledger
KLA .204 PSL Wafer, KLA Archer 10 Overlay Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | KLA Archer 10 Overlay Measurement |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[1] | — |
| Traceability | NIST[2] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[1] | — |
| OEM | — | KLA[3] |
| Model | — | Archer 10[3] |
| Category | — | Metrology & Inspection[4] |
| Description | — | Overlay measurement[5] |
| Version | — | 300mm[5] |
| Automated overlay measurement module | — | Fully automated[6] |
| Wafer handling | — | 200mm dual open[6] |
| Wafer handler | — | 200mm dual port open wafer handler[7] |
| Software | — | Windows NT based SW and User Interface[6] |
| Computer | — | KLASS RS2 computer[7] |
| Computer upgrade | — | XP computer upgrade[7] |
| Integration software | — | KLASS station integration software[6] |
| Optical module | — | coherence probe interference microscope[6] |
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