Comparison ledger
KLA 1007, LTX-Credence Ismeca NY32W, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Ismeca NY32WLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence Ismeca NY32W |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| Platform positions | — | 32-position turret platform[1] |
| Media | — | Semiconductors on film-frame wafer media[1] |
| Yield | — | Highest inspection yield[1] |
| Automation features | — | Intelligent features enable extended autonomous operation and productivity[1] |
| Platform type | — | 32-position turret platform[1] |
| Inspection yield | — | providing highest inspection yield[1] |
| Number of positions | — | 32[1] |
| Media type | — | film-frame wafer[1] |
| Function | — | inspection[1] |
| Primary application | — | Inspection[1] |
| Turret positions | — | 32[1] |
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