Comparison ledger
KLA 1007, LTX-Credence D 10, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | D 10LTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence D 10 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | Software vs. 2.1.1.4[3] |
| Software Version | — | 2.1.1.4[3] |
| Workstation | — | SuperMicro Workstation[4] |
| Module - DPIN 96 16 M | — | DPIN 96 16 M (quantity 5)[4] |
| Module - DPIN 96 32 M | — | DPIN 96 32 M[4] |
| Module - DPS 16 | — | DPS 16[4] |
| Module - DIBU | — | DIBU[4] |
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