Comparison ledger
KLA 1.112 PSL Wafer, Nordson XD 7600 NT, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | XD 7600 NTNordson | |
|---|---|---|
| OEM | KLA | Nordson |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1.112 PSL Wafer | Nordson XD 7600 NT |
| Specifications | ||
| Configuration | NIST Traceable[1] | Includes HDD and Software[3] |
| Wafer Size | 8 inch[1] | — |
| NIST Traceable | True[1] | — |
| Compatible Tools | Surfscan 6xy0 and Sp1[2] | — |
| Operating System | — | Windows XP[3] |
| Phase | — | 1 Phase[4] |
| X-ray tube type | — | Sealed-transmissive (NT100)[5] |
| X-ray tube max voltage | — | 160 kV[6] |
| X-ray tube power | — | 10 W[5] |
| Feature recognition resolution | — | < 0.1 µm[6] |
| Detector | — | χiDAT3 Digital Image Intensifier, 2 MP @ 25 fps[6] |
| Geometric magnification | — | 2,000×[6] |
| System magnification | — | 12,000×[6] |
| Total digital zoom magnification | — | 60,000×[6] |
| Max sample dimensions | — | 736 mm × 580 mm (29″ × 22.8″)[6] |
| Tilt capability | — | Up to 70° at constant magnification[6] |
| Display | — | Dual 24″ TFT LCD Monitors[6] |
| Active X-ray Image Stabilization (AχiS) | — | Standard[6] |
| Power | — | Single Phase 200-230Vac, 16A, 50/60 Hz[5] |
| Max power consumption | — | 1000 W[5] |
| System weight | — | 1950 kg (4300 lbs)[5] |
| Equipment type | — | X-ray inspection system[3] |
| Category | — | Metrology & Inspection[7] |
| Feature recognition | — | below 0.1 µm[7] |
| Includes | — | HDD and Software[3] |
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