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Comparison ledger

0035235-003 MMD HeadversusMIS 200 Defect Review

KLA 0035235-003 MMD Head, SCREEN MIS 200 Defect Review, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMKLASCREEN
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 0035235-003 MMD HeadSCREEN MIS 200 Defect Review
Specifications
ConfigurationTSTD PCB ASSY, MMD MEAS HEAD[1]—
Model0035235-003[1]MIS 200[3]
MakeKLA[1]SCREEN / DNS[3]
Part DescriptionTSTD PCB ASSY, MMD MEAS HEAD[1]—
Compatible SystemKLA AIT-XP[1]—
Manufacturer—SCREEN[2]
Tool name—MIS 200 Defect Review[2]
Wafer Sizes—8 inch[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]Equipment inventory listing