Comparison ledger
KLA 0035235-003 MMD Head, KLA Candela 8720 Surface Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | KLA Candela |
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[1] | Optical System Unit[2] |
| Model | 0035235-003[1] | — |
| Make | KLA[1] | — |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[1] | — |
| Compatible System | KLA AIT-XP[1] | — |
| Single Wafer Loading | — | Automatic Transfer by Wafer Transfer Robot[2] |
| Wafer Thickness Detection | — | Laser Transmission Thickness Detection Module (DTD), Laser Diode 660 nm[2] |
| CPU | — | XEON E5-2620 2.0 GHz, 20 MB cache[2] |
| HDD | — | 3TB[2] |
| Network Card | — | Ether Network Card[2] |
| Monitor | — | 19 inch LCD Monitor[2] |
| Pointing Device | — | Optical Trackball[2] |
| Wafer Sizes | — | 2 inch[2] |
| Laser Light Source | — | 405 nm Laser Diode; 660 nm Laser Diode[2] |
| Detection Channel | — | Scatter (Oblique, Normal); Specular; Topography; Phase; PL (Option)[2] |
| Transfer Unit | — | Single Wafer Loading; Automatic Transfer by Wafer Transfer Robot[2] |
| Operating System | — | Microsoft Windows Server 2008 Operating system (English Version)[2] |
| Application Software | — | Candela 8720 Application Software, Version 10[2] |
| Custom Specifications | — | Transformer for stepping up the power supply voltage from 200 V to 230 V[2] |
| Candela 8720 Application Software | — | Version 10[2] |
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