Keysight
3070 Series 3 ICT alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
ASM 2160
Test & Probe
The Teradyne/Eagle ASM 2160 is a final test system for electronic components and printed circuit boards, compatible with the Teradyne Eagle ETS 364 tester.
Teradyne
TS 121 ICT
Test & Probe
The Teradyne TS 121 ICT is an in-circuit tester configured with Windows XP and Teradyne Navigate 6.4.0.0.28 software.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
Signatone
1070
Test & Probe
The Signatone 1070 is a probe station.
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