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Comparison ledger

JSM-7500Fversus0035235-003 MMD Head

JEOL JSM-7500F, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMJEOLKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyJEOL JSM-7500FKLA 0035235-003 MMD Head
Specifications
Instrument typeScanning Electron Microscope (SEM)[1]—
Model designationJEOL 7500F HRSEM[1]—
Resolution at 30 kV0.8 nm[1]—
Resolution at 1 kV1 nm[1]—
DetectorsSecondary electron, backscattered electron, and scanning-transmission electron detectors[1]—
Imaging modeGentle-beam mode via stage biasing system[1]—
Chemical characterizationEDAX Energy Dispersive x-ray spectrometer (EDS) available for spectra or element maps[1]—
Gentle beam modeStage biasing system reduces electron beam energy for imaging soft or insulating samples without coating[1]—
EDSEDAX Energy Dispersive x-ray spectrometer available[1]—
Electron Sourcefield emission electron gun (field emission SEM)[2]—
Lens Typesemi-in-lens type objective lens[2]—
Unique FeatureGentle Beam (GB mode) for top-surface imaging with ultra-low energy incident electrons[3]—
Applicationhigh-resolution imaging of large specimens; suitable for observing shallow surfaces of samples[2]—
Electron Gun TypeField emission[2]—
Objective Lens TypeSemi-in-lens[2]—
Beam ModeGentle Beam (GB)[2]—
Low Voltage CapabilityDown to several hundred eV[2]—
Resolution QualityExtremely high (stated)[2]—
Application FocusObservation of shallow surfaces[2]—
Configuration—TSTD PCB ASSY, MMD MEAS HEAD[4]
Model—0035235-003[4]
Make—KLA[4]
Part Description—TSTD PCB ASSY, MMD MEAS HEAD[4]
Compatible System—KLA AIT-XP[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]nano.upenn.edunano.upenn.edu
  2. [2]web.archive.orgweb.archive.org
  3. [3]jeol.comjeol.com
  4. [4]inventory listing