Comparison ledger
Hitachi S 4000, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | S 4000Hitachi | |
|---|---|---|
| OEM | Hitachi | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Hitachi S 4000 | KLA 0035235-003 MMD Head |
| Specifications | ||
| Configuration | with Kevex 3600-0615[1] | TSTD PCB ASSY, MMD MEAS HEAD[3] |
| Instrument type | Scanning electron microscope (SEM)[1] | — |
| Category | Metrology & Inspection[2] | — |
| Primary function | Examines material surfaces and structural detail at high magnification[2] | — |
| Application area | Semiconductor and related precision-manufacturing work[2] | — |
| Documented configuration | With Kevex 3600-0615[1] | — |
| Model | — | 0035235-003[3] |
| Make | — | KLA[3] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[3] |
| Compatible System | — | KLA AIT-XP[3] |
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