Comparison ledger
Eagle J750, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | J750Eagle | 1007KLA |
|---|---|---|
| OEM | Eagle | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 1998– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Eagle J750 | KLA 1007 |
| Cited variants | — | |
| Specifications | ||
| Product family | J750[2] | — |
| Platform context | Listed among Teradyne semiconductor test platforms[2] | — |
| Installed base | Over 6,000 test systems[1] | — |
| Maximum pins | 2048 multifunction pins[1] | — |
| Maximum data rate | 400 MHz/800 Mbps[1] | — |
| Test program development time | IG-XL software enables thirty percent faster development of multisite test programs[1] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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