Comparison ledger
Cascade Microtech 103-754, Signatone H-100, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 103-754Cascade Microtech | H-100Signatone |
|---|---|---|
| OEM | Cascade Microtech | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | 6-inch diameter microchamber and thermal chuck | three inch square device / substrate chuck |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 103-754 | Signatone H-100 |
| Cited variants | — | |
| Specifications | ||
| type | x-y-z-θ probe positioner[2] | — |
| installed on | HFTL 50-GHz Small-Signal Probe Station[2] | — |
| quantity in station | two[2] | — |
| station chuck size | 6-inch-diameter microchamber and thermal chuck[2] | — |
| Quantity per station | Two positioners[2] | — |
| Chuck size | 6-inch-diameter microchamber and thermal chuck[2] | — |
| Temperature range | -50 to 200 °C[2] | — |
| device/substrate chuck | — | three inch square[3] |
| primary applications | — | probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits[3] |
| series variants | — | H-100, H-120 and H-150[3] |
| device stage travel | — | four inches of X-Y travel[3] |
| platen motion | — | linear motion platen that can be raised and lowered using either a crank or a lever[3] |
| microscope tower | — | for mounting Stereozoom optics in a fixed position[3] |
| optional microscope stage | — | 4" x 4" microscope stage[3] |
| micropositioners | — | up to six magnetic based micropositioners[3] |
| probe card adapter | — | accepts a probe card adapter for use with probe cards[3] |
| micropositioner electrical connections | — | six pin jacks that correspond to color coded banana plugs[3] |
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