Comparison ledger
Bruker Dektak 8, KLA 1.112 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Dektak 8Bruker | |
|---|---|---|
| OEM | Bruker | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker Dektak | KLA 1.112 PSL Wafer |
| Specifications | ||
| Configuration | Chambers (2)[1] | NIST Traceable[3] |
| Type | Contact profilometer[2] | — |
| Vertical step range | Tens of nanometers to 1 mm[2] | — |
| Maximum scan length | 50 mm[2] | — |
| Maximum sample size | 8 inches[2] | — |
| Wafer Size | — | 8 inch[3] |
| NIST Traceable | — | True[3] |
| Compatible Tools | — | Surfscan 6xy0 and Sp1[4] |
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