Comparison ledger
Bruker ContourGT X 3 D Optical Profiler, Wyko NT-2000, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NT-2000Wyko | |
|---|---|---|
| OEM | Bruker | Wyko |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker ContourGT X 3 D Optical Profiler | Wyko NT-2000 |
| Specifications | ||
| Configuration | Single Phase[1] | — |
| Full Load Power | 400 VA[2] | — |
| AC Input | 115/230 V[2] | — |
| Manufacturer | Bruker[2] | — |
| Category | Precision Optics[2] | — |
| Electrical configuration | Single Phase[2] | — |
| Frequency | 50/60 Hz[2] | — |
| Vintage | 2022[1] | — |
| measurement type | — | non-contact surface metrology / optical profiling[3] |
| height measurement range | — | 0.1 nm to several millimeters[3] |
| vertical resolution | — | as low as 0.1 nm[3] |
| automation | — | fully automated production version available; non-automated versions available for R&D[3] |
| motion/stage features | — | high speed auto focus, auto turret, and computer-controlled stage[3] |
| analysis capability | — | 3-D surface analysis with powerful analysis software[3] |
| Measurement height range | — | 0.1 nm to several millimeters[3] |
| Measurement type | — | non-contact surface metrology[3] |
| Automation | — | fully automated; high speed auto focus, auto turret, computer-controlled stage[3] |
| Precision | — | submicron precision[3] |
| Field of view | — | large field-of-view area measurements[3] |
| Qualification | — | gage-qualified instrument[3] |
| Configurations | — | non-automated versions available for R&D applications[3] |
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