Comparison ledger
Applied Materials SEMVision G 2 CD-SEM, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | SEMVision G 2 CD-SEMApplied Materials | |
|---|---|---|
| OEM | Applied Materials | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials SEMVision | KLA 0035235-003 MMD Head |
| Specifications | ||
| Configuration | With EDX (Energy Dispersive X-ray Spectroscopy)[1] | TSTD PCB ASSY, MMD MEAS HEAD[3] |
| Largest Load | 8 A[1] | — |
| Full Load Current | 10 A[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Model | SEMVision G 2[1] | 0035235-003[3] |
| Tool type | CD-SEM (Critical Dimension Scanning Electron Microscope)[1] | — |
| Category | Metrology & Inspection[2] | — |
| Wafer size | 12 inch[1] | — |
| EDX | Included[1] | — |
| HDD and software | Included[1] | — |
| Make | — | KLA[3] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[3] |
| Compatible System | — | KLA AIT-XP[3] |
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