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Comparison ledger

0720 06060 PartversusOpus 3 SH

Applied Materials 0720 06060 Part, Semics Opus 3 SH, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
Opus 3 SHSemics
OEMApplied MaterialsSemics
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartSemics Opus
Cited variants—
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[2]Flat top plate for bigger test head application[3]
Full Load Current—11 A[3]
Max Ampere Rating—25 A[3]
Interruption Capacity—10 kA[3]
Type—Automatic[1]
Wafer size—6 Inches, 8 Inches, 12 Inches[1]
Accuracy—1 µm[1]
Chuck size—175 x 175 mm[1]
Operating temperature—-40 to 200 Degree C[1]
Overall dimensions—1490 x 1680 x 960 mm[1]
Probing force—450 kgf[1]
Part number—OPUS3 SH[1]
Manufacturer—SEMICS Inc[1]
Voltage—200~240 V[3]
Frequency—50/60 Hz[3]
Chuck type—12 inch nickel hot chuck[3]
Ampere rating—15 A[3]
Vintage—2019[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]semiconductor.directorysemiconductor.directory
  2. [2]inventory listing
  3. [3]inventory listing