Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Bruker Dektak 3030, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | Dektak 3030Bruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Bruker Dektak 3030 |
| Specifications | ||
| Make | Applied Materials[1] | — |
| Model | 0010-22161[1] | Dektak 3030[3] |
| Description | HTESC PH 1 REV A[2] | — |
| Condition | Used[2] | — |
| Stock Number | BM6628[2] | — |
| Manufacturer | — | Bruker / Veeco[3] |
| Wafer size | — | 8 inch[3] |
| Vertical range | — | 100 angstroms(A) to 1,310KA[4] |
| Vertical resolution | — | 1A/65KA, 20A/1,310KA[4] |
| Scan length range | — | 50 microns to 50mm[4] |
| Scan speed ranges | — | Low, medium, high[4] |
| Software leveling | — | 2-point programmable or cursor leveling[4] |
| Stage leveling | — | Manual[4] |
| Stylus force | — | 1mg to 40mg[4] |
| Maximum sample thickness | — | 45mm(1.5")[4] |
| Sample stage diameter | — | 165mm[4] |
| Zoom magnification | — | 60X to 420X[4] |
| Motorized zoom camera | — | Solid state monochrome image[4] |