Comparison ledger
Advantest T 5851, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5851Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5851 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Manufacturer | Advantest[2] | KLA[3] |
| Model | T 5851[2] | 1007[3] |
| Product type | Tester[2] | — |
| Target devices | Protocol I/F NAND, UFS[1] | — |
| Supported memory examples | UFS4.0 universal flash storage and PCIe Gen 5 Protocol embedded NAND[1] | — |
| Parallel testing | 512[1] | — |
| Test speed | Up to 32Gbps[1] | — |
| Software | FutureSuite OS (ATL and MPAT compatible)[1] | — |
| Vintage | 2016[2] | 01.06.1995[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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