Comparison ledger
Advantest 93000 Smart Scale, Teradyne J 750 EX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 93000 Smart ScaleAdvantest | J 750 EXTeradyne |
|---|---|---|
| OEM | Advantest | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest 93000 | Teradyne J 750 EX |
| Cited variants | — | |
| Specifications | ||
| Workstation | Z640[4] | — |
| SD Cable | 9[4] | — |
| HD Cable | 4[4] | — |
| PS1600A | 13[4] | — |
| 9G | 3[4] | — |
| DPS64 | 2[4] | — |
| UHC4T(SPIL) | 3[4] | — |
| Thermal Head | STH[5] | — |
| Total Cards | 11[5] | — |
| PS1600B | 6[5] | — |
| UHC4 | 8[6] | — |
| UHC 4 | 6[7] | — |
| PS9G | 1[9] | — |
| UHC4T | 3[9] | — |
| Configuration | Workstation: Z4G4 - Thermal Head: CTH - Total Cards: 14 - PS1600B: 6 - PS9G: 3[18] | DSIO[3] |
| Component | PS1600A[4] | — |
| Equipment type | — | Tester[1] |
| Model | — | J 750 EX[1] |
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