Comparison ledger
ADE NanoMapper FA Nano-Defects, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | ADE | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ADE NanoMapper FA Nano-Defects | KLA 0035235-003 MMD Head |
| Specifications | ||
| Attachments | 3 Files[1] | — |
| Wafer size | 300 mm[1] | — |
| Configuration | — | TSTD PCB ASSY, MMD MEAS HEAD[2] |
| Model | — | 0035235-003[2] |
| Make | — | KLA[2] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[2] |
| Compatible System | — | KLA AIT-XP[2] |
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